Burn-in Tester
CM1028 SoC Burn-in Tester
Be designed to conduct burn-in tests for SoC devices in mass production
It is designed to conduct burn-in tests for SoC devices in mass production. It is used to conduct burn-in tests for devices with high reliability like autonotive-grade devices.
CM1028 SoC Burn-in Tester
Specifications
System Features
With independent socket temperature control function and chip burn-in test temperature range of ambient temperature~150°C. The tester can be used to conduct burn-in tests for high power consumption devices like automotive-grade devices. With high levels of automation and blade units with high flexibility which makes the tester easy to be operated.
Maximum Chip Power Consumption Supported
150W
Tester Dimensions
2,820mm (L)×1,710mm (W)×2,385mm (H)
Temperature Range
Ambient temperature~150°C
Temperature Control Mode
Independent socket temperature control
Temperature Accuracy
±5°C
The Number of IO Channels
256
VIH Range
0.5~4V
The Number of DPS
16
DC POWER
2 sets
Maximum Data Rate
10Mhz
Vector Depth
32M