Power Tester
CTT3280F Power Tester
A high performance tester intended for mass-produced power semiconductor discrete devices
With test specification of 1000V/10A, it is applicable to CP tests, and the major devices it can test including MOS, diodes, triodes, and more. The tester has a 16-site parallel test structure.
CTT3280F Power Tester
Specifications
Features
1. Test specification of each test site is 1000V/10A and the maximum test site mode supported is 16-site parallel test sites.
2. Floating source structure improves test accuracy and test stability.
3. Support mRdon dual chip tests and the test accuracy can reach 0.1mR.
4. Special leakage measuring loop and the measuring accuracy can reach pA level.
5. Support DC+EAS+Rg tests.
6. Convenient online self check without connection to external self check boards.
7. Support DPAT test.
8. Support SESE/GEM protocol.
Test Specification
1000V 20A
Maximum Number of Test Sites
16
Leakage Test Accuracy
0.1nA
Rdon Test Accuracy
0.1mR